In Situ TEM Probing of Ferroelectric Switching under Electrical Bias

Xiaoqing Pan,Lin-Ze Li,Mingjie Xu,Sheng Dai,Thomas Blum
DOI: https://doi.org/10.1017/s1431927618009546
IF: 4.0991
2018-01-01
Microscopy and Microanalysis
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