Superlattice-like Sb-Ge Thin Films for High Thermal Stability and Low Power Phase Change Memory

Shiyu Chen,Ke Yang,Weihua Wu,Jiwei Zhai,Zhitang Song
DOI: https://doi.org/10.1016/j.jallcom.2017.12.146
IF: 6.2
2018-01-01
Journal of Alloys and Compounds
Abstract:The thermal properties of Sb-Ge superlattice-like thin films have been experimentally studied for phase change memory. The Sb-Ge superlattice-like thin films have a high crystallization temperature (223 degrees C). The interdiffusion coefficient D-lambda was determined by measuring the intensity of the low-angle X-ray diffraction arising from the modulation as a function of annealing time. The temperature dependence in the temperature range 80-200 degrees C is described by D-lambda = 8.3 x10(-24) exp(-0.24 eV/kT)m(2)/s The thermal stability of Sb-Ge superlattice-like thin films can also dramatically be improved with the increase of the temperature. The density variation of Sb-Ge superlattice-like thin films changes by only around 8% between amorphous and crystalline states, which is very important for device reliability. The threshold current and threshold voltage of a cell based on Sb-Ge are 8.15 mu A, 1.07 V, respectively. The lower RESET power is presented in the PCM cells of Sb-Ge superlattice-like thin films, benefiting from its high resistivity. (C) 2017 Elsevier B.V. All rights reserved.
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