Study on the crystallization of Mg35Sb65/Sn15Sb85 superlattice-like films for phase change memory application

Song Sun,Yifeng Hu,Tianshu Lai,Xiaoqin Zhu
DOI: https://doi.org/10.1007/s10854-020-03794-w
2020-06-17
Abstract:In this paper, the Mg<sub>35</sub>Sb<sub>65</sub>/Sn<sub>15</sub>Sb<sub>85</sub> superlattice-like films were prepared by magnetron sputtering and the comprehensive properties of were systematically studied. The amorphous-to-crystalline transformation was researched with a situ resistance–temperature measurement system to evaluate the thermal stability. X-ray diffraction, Raman and transmission electron microscopy were employed to explore the change of phase structure at different annealing temperatures. The reversible resistance switching was achieved for [MgSb(7 nm)/SnSb(3 nm)]<sub>5</sub>-based devices. The results showed that Mg<sub>35</sub>Sb<sub>65</sub>/Sn<sub>15</sub>Sb<sub>85</sub> superlattice-like film was a promising phase change material with good thermal stability, fast phase transition and low power consumption.
engineering, electrical & electronic,materials science, multidisciplinary,physics, condensed matter, applied
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