Effect of Poling Process on Resistive Switching in Au/BiFeO3/SrRuO3 Structures

Hui Zhu,Yingqiao Zhang,Anquan Jiang,Zilong Bai,Shiwei Feng,Pengfei Wang,Xiao Meng,Qiong Qi
DOI: https://doi.org/10.1063/1.4972302
IF: 4
2016-01-01
Applied Physics Letters
Abstract:We studied the resistive switching of Au/BiFeO3/SrRuO3 structures. Their current–voltage characteristics complied with space-charge-limited (SCL) conduction. A full cycle of the poling process enlarged the I–V hysteresis and increased the transition voltage from Ohmic to SCL for an I–V sweeping bias less than the coercive voltage. A cycle of poling could increase the resistance switching ratio under low bias by 20 times over that of a virgin sample without poling. Measurements of thermally stimulated current showed a difference between the sample in the pristine state and that under the polarization state, indicating a relationship between the trap filling status and the resistive switching behavior.
What problem does this paper attempt to address?