Oxide Transistors: Metal Oxide Transistors Via Polyethylenimine Doping of the Channel Layer: Interplay of Doping, Microstructure, and Charge Transport (adv. Funct. Mater. 34/2016)

Wei Huang,Li Zeng,Xinge Yu,Peijun Guo,Binghao Wang,Qing Ma,Robert P. H. Chang,Junsheng Yu,Michael J. Bedzyk,Tobin J. Marks,Antonio Facchetti
DOI: https://doi.org/10.1002/adfm.201670223
IF: 19
2016-01-01
Advanced Functional Materials
Abstract:Enhanced metal oxide (In2O3, IZO, IGZO) transistor performance via polyethylenimine (PEI) doping is demonstrated by J. Yu, M. J. Bedzyk, T. J. Marks, A. Fachetti, and co-workers on page 6179. PEI electron donating capacity combined with charge trapping and variation in the matrix film microstructure contribute, for proper PEI doping levels, to high electron mobility, optimal TFT off-currents, and optimal threshold voltages. This concept is promising for opto-electronic devices based on metal oxide films.
What problem does this paper attempt to address?