The Impact of Nonlinear Junction Capacitance on Switching Transient and Its Modeling for SiC MOSFET
Kainan Chen,Zhengming Zhao,Liqiang Yuan,Ting Lu,Fanbo He
DOI: https://doi.org/10.1109/ted.2014.2362657
IF: 3.1
2014-01-01
IEEE Transactions on Electron Devices
Abstract:The nonlinear junction capacitances of power devices are critical for the switching transient, which should be fully considered in the modeling and transient analysis, especially for high-frequency applications. The silicon carbide (SiC) MOSFET combined with SiC Schottky Barrier Diode (SBD) is recognized as the proposed choice for high-power and high-frequency converters. However, in the existing SiC MOSFET models only the nonlinearity of gate-drain capacitance is considered meticulously, but the drain-source capacitance, which affects the switching commutation process significantly, is generally regarded as constant. In addition, the nonlinearity of diode junction capacitance is neglected in some simplified analysis. Experiments show that without full consideration of nonlinear junction capacitances, some significant deviations between simulated and measured results will emerge in the switching waveforms. In this paper, the nonlinear characteristics of drain-source capacitance in SiC MOSFET are studied in detail, and the simplified modeling methods for engineering applications are presented. On this basis, the SiC MOSFET model is improved and the simulation results with improved model correspond with the measured results much better than before, which verify the analysis and modeling.