Influence of O2 Partial Pressure on the Micro-structure of ZrO2 Thin Films by Electron Beam Evaporation

陈松林,赵北君,朱世富,马平,胡建平,胡江川
DOI: https://doi.org/10.3969/j.issn.0490-6756.2004.04.020
2004-01-01
Abstract:Influence on the micro-structure of ZrO_2 thin films at different conditions of the substrates circumrotation and different oxygen pressure was analysed by X-ray diffraction technology. The structure of ZrO_2 thin films can be changed from tetragonal to monoclinic with the substrates revolve at the same low-O_2 pressure condition(P≤1.1×10 -2 Pa). With further increase of O_2 pressure morphology transition will occur from polycrystalline to amorphism. In addition the substrates revolve can decrease the influence of O_2 pressure on the surface roughness and crystallite size. The result of laser damage threshold determination indicates that O_2 pressure condition can influence laser damage of ZrO_2 thin films,and polycrystalline structure is better than amorphism.
What problem does this paper attempt to address?