Experimental Investigation of Power Loss Characteristics of Large Capacity GTOs

LI Qingmin,XU Guozheng,HUANG Yulong,QIAN Jiali,ZHANG Jierong
DOI: https://doi.org/10.3321/j.issn:1000-0054.2000.03.001
2000-01-01
Abstract:To meet the increasing stringent test requirements for high power gate turn off thyristor(GTO), a large capacity circuit (40MVA/5kV/8kA) was built with fast response instrumentation for GTO tests. A general rule was presented for selecting suitable voltage and current transducers with detailed analysis of the main factors affecting GTO switching waveforms. The parameter arrangements of the main circuit and the Snubber circuit were varied to provide a comprehensive investigation of GTO dynamic power loss characteristics. The improved loss calculation method can improve the accuracy of digital oscilloscopes with a measurement error of less than 5%. The test strategy and the results provide valuable information for both the dynamic switching behavior investigation and the system design of GTO.
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