Research on Micro Structures of Si Surfaces after Wet Chemical Etching

S.F.Y.Li
DOI: https://doi.org/10.3969/j.issn.1671-4776.2003.03.005
2003-01-01
Abstract:With the improvement of integration in semiconductor industry and the development of micro-nano technologies, wet etching of Si and the flatness and cleanness of Si surface after wet etching have much more influence on semiconductor devices. More and more research work has been done in this field. In our work, the morphologies and cleanness of Si (111) surface etched in several NU4F-HCl solutions have been studied by using Scanning Tunneling Microscope (STM) . Analysis of the surface STM images indicate that higher pH NH4F-HCl solution leads to smoother surfaces.
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