Experiment Study on Micro-Structure on Different Crystallographic Planes of Mc-Si Etched in Alkaline Solution

KunXia Wang,ShiMeng Feng,HuaTian Xu,JiaTong Tian,ShuQuan Yang,JianHua Huang,Jun Pei
DOI: https://doi.org/10.1007/s11431-012-4807-8
2012-01-01
Science China Technological Sciences
Abstract:The investigation of multi-crystalline silicon (mc-Si) surface etching technology is a key point in solar cell research. In this paper, mc-Si surface was etched in the common alkaline solution modified by an additive for 20 minutes at 78–80°C. Samples’ surface morphology was observed by scanning electron microscope (SEM). It is firstly found that the etched mc-Si surface has the uniform distribution of trap pits although the morphologies of trap pits are slightly different on different crystallographic planes. Si (100) plane was covered with many small Si-mountain ranges or long V-shape channels arranged in a crisscross pattern. For (110) plane and (111) plane, they were full of a lot of triangle pit-traps (or quadrilateral holes) and twisted earthworm trap pits, respectively. The measured reflectance of the sample was 20.5% at wavelength range of 400–900 nm. These results illustrate that alkaline solution modified by an additive can effectively etch out trap pits with a good trapping light effect on mc-Si surfaces. This method should be very valuable for mc-Si solar cells.
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