Research on Silicon Shallow Junction UV Detectors

CHEN Wu,WANG Yong,WANG Shui-di,CHAN Yi-lin,Mikko Matikkala
DOI: https://doi.org/10.3969/j.issn.1001-5868.2000.03.016
2000-01-01
Abstract:A silicon UV detector with shallow junction structure is presented . The device is fabricated by low energy implantation.Structure design and fabrication technology are discussed.Main measurement results are given. The test results indicate that this detector has a high sensitivity to UV light in the wavelength range from 200 to 400 nm.
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