Testing Method of Reset Row-by-row Snapshot Charge Amplifier CMOS Readout IC for Focal Plane Array

高峻,陈中建,鲁文高,吉利久,赵建忠,董硕
DOI: https://doi.org/10.3969/j.issn.1001-5078.2004.06.019
2004-01-01
Abstract:The testing method and measurement results of RRSCA(Reset Row-by-row Charge Amplifier) are presented in this paper.That circuit works based on charge transfer principle and resets row by row.For testing,test MOSFETs are inserted for testing to simulate the photo current,and the circuit timing can be adjusted to change the work mode.A novel testing method is introduced for measuring the inner parasitic parameters.The other important parameters are also measured.
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