Optimization of Ta Buffer Layer in IrMn Top Spinvalve

刘华瑞,任天令,曲炳郡,刘理天,库万军,李伟
DOI: https://doi.org/10.3969/j.issn.1005-8192.2003.06.005
2003-01-01
Abstract:Ta single layer,Ta/NiFe bilayer and IrMn top spinvalves were prepared by DC magnetron sputtering on Si/SiO 2 substrate.The microstructure and magnetic properties of the Ta,Ta/NiFe films and spinvalve were investigated.Results show that the magnetoresistance ratio,coercivity and exchange bias field of the spinvalves are strongly related to the thickness of the Ta buffer layer.The magnetoresistance ratio and exchange bias field reached the maximum of 9.24% and 255×(10 3/4π)A/m,respectively,with a 3nm thick Ta buffer layer,while the coercivity was 2.43×(10 3/4π)A/m.
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