The Photoelectric Dual Function Transformation of TEM In Situ Sample Rod and It’s Power System’s Optimization Design

Shibin ZHANG,Li YANG,Haixia HAN,Hui DONG,Feng? XU
DOI: https://doi.org/10.3969/j.issn.1005-9490.2015.02.001
2015-01-01
Abstract:In order to develop a transmission electron microscope sample rod for optical and electrical dual situ-test,we upgrade an imported electrical sample rod to make it possible to simultaneously measure light-electrical characteristics of the sample by introducing pico LED chips as the light source based on the circuit design and elec-trode structure of the sample rod. And we also optimize the optical-electrical substrate power supply system to ensure the quality of TEM imaging. Test results show that the transformed sample rod works well and the image of the sample is clear and stable with the substrate power supply system.
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