Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy

Josh Kacher,Yao Xie,Sven P. Voigt,Shixiang Zhu,Henry Yuchi,Jordan Key,Surya R. Kalidindi
DOI: https://doi.org/10.48550/arXiv.2104.08688
2021-08-21
Abstract:Transmission Electron Microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data collection at a microsecond frame rate. Taking advantage of these advances in data collection rates requires the development and application of data processing tools, including image analysis, feature extraction, and streaming data processing techniques. In this paper, we highlight a few areas in materials science that have benefited from combining signal processing and statistical analysis with data collection capabilities in TEM and present a future outlook on opportunities of integrating signal processing with automated TEM data analysis.
Computer Vision and Pattern Recognition
What problem does this paper attempt to address?
The problem that this paper attempts to solve is how to use signal processing techniques to meet the challenges brought by high - volume data acquisition in in - situ transmission electron microscopy (in - situ TEM), especially in the characterization of material structures and chemical properties. With the progress of electron detection technology and computing power, TEM has been able to perform high - speed data acquisition at a microsecond frame rate, which brings a large amount of data and also poses difficulties in data processing and analysis, because the huge amount of data makes manual image analysis impractical. In addition, the paper also explores how to improve the understanding and quantification ability of transient phenomena by combining signal processing and statistical analysis techniques, especially in in - situ experiments. Specifically, the paper focuses on developing automated data - processing tools for the analysis of material microstructures and crystal structures, especially for the quantitative analysis of transient phenomena. By applying these tools, more quantitative and statistically more significant results can be generated, thus promoting the development of materials science.