Development of a Low-Energy Electron Point Source Microscope and Some Initial Experimental Results on It

Bai Xin,Xiao GuiLi,Yu Jie,Zhang ZhaoXiang,Guo DengZhu,Zhao XingYu,Xue ZengQuan,Zhang GengMin
DOI: https://doi.org/10.3969/j.issn.1003-8892.2006.05.010
2006-01-01
Abstract:A facility has been developed that can function as a low-energy electron point source(LEEPS) microscope or a field-emission microscope(FEM).During the development,the following problems were tackled: the obtainment of ultrahigh vacuum(UHV),the isolation of external vibration,the design of the inch-worm and its controlling circuit,automatic measure-ment of the curves of field emission current versus applied voltage(I-V curves) and sample transfer in UHV,etc.In the initial run,projection images with a magnification larger than 104 were achieved and I-V curves of a multiwalled carbon nanotube(MWCNT) were also acquired.
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