Development of Coherent Electron Beam Instrument

ZHANG Zhao-xiang,BAI Xin,YU Jie,ZHANG Geng-min,ZHAO Xing-yu,XUE Zeng-quan
DOI: https://doi.org/10.3969/j.issn.1002-8935.2006.01.015
2006-01-01
Abstract:The coherent electron beam,whose characteristics can be studied with Point Projection Microscope,provides important information of the sample under observation.High-brightness coherent electron beam,when employed in the electrical optics systems,greatly improves the spatial and energy resolution of the instrument.It can be applied in the field of electron holography and electron interference measurement as well.The Low-Energy Electron Point Source Microscope described in this article works in three modes: ① Point Projection Microscope mode,in which the characteristics of coherent electron beams can be studied;② Field Ion Microscope mode,in which information of surface atom structure is obtained;③ Field Emission Microscope mode,in which the field emission ability of the tip-shaped samples are investigated.The whole system is equipped in an ultra-high vacuum chamber whose base pressure reaches 3.1×10~(-8) Pa.Enlarged projection images of bronze grid are observed with this versatile instrument.
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