Low-voltage coherent electron imaging based on a single-atom electron

Wei-Tse Chang,Chun-Yueh Lin,Wei-Hao Hsu,Mu-Tung Chang,Yi-Sheng Chen,En-Te Hwu,Ing-Shouh Hwang
DOI: https://doi.org/10.48550/arXiv.1512.08371
2015-12-28
Abstract:It has been a general trend to develop low-voltage electron microscopes due to their high imaging contrast of the sample and low radiation damage. Atom-resolved transmission electron microscopes with voltages as low as 15-40 kV have been demonstrated. However, achieving atomic resolution at voltages lower than 10 kV is extremely difficult. An alternative approach is coherent imaging or phase retrieval imaging, which requires a sufficiently coherent source and an adequately small detection area on the sample as well as the detection of high-angle diffracted patterns with a sufficient resolution. In this work, we propose several transmission-type schemes to achieve coherent imaging of thin materials (less than 5 nm thick) with atomic resolution at voltages lower than 10 kV. Experimental schemes of both lens-less and lens-containing designs are presented and the advantages and challenges of these schemes are discussed. Preliminary results based on a highly coherent single-atom electron source are presented. The image plate is designed to be retractable to record the transmission patterns at different positions along the beam propagation direction. In addition, reflection-type coherent electron imaging schemes are also proposed as novel methods for characterizing surface atomic and electronic structures of materials.
Instrumentation and Detectors,Materials Science
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