Probing Transient Localized Electromagnetic Fields Using Low-Energy Point-Projection Electron Microscopy

Germann Hergert,Andreas Wöste,Jan Vogelsang,Thomas Quenzel,Dong Wang,Petra Gross,Christoph Lienau,Andreas Wöste

DOI: https://doi.org/10.1021/acsphotonics.1c00775

IF: 7

2021-08-11

ACS Photonics

Abstract:Low kinetic energy electrons are of interest for probing nanoscale dynamic processes using ultrafast electron microscopy techniques. Their low velocities reduce radiation doses and enhance the interaction with confined electromagnetic fields and, thus, may enable ultrafast spectroscopy of single nanostructures. Recent improvements in the spatial and temporal resolution of ultrafast, low-energy electron microscopy have been achieved by combining nanotip photoemitters and point-projection imaging schemes. Here, we use such an ultrafast point-projection electron microscope (UPEM) to analyze the interaction of low-energy electrons with transient electric fields created by photoemission from a nanogap antenna. By analyzing their kinetic energy distribution, we separate angular deflection due to radial field components from electron energy gain and loss due to their axial acceleration. Our measurements open up a route toward the spatial and temporal characterization of vectorial near-fields by low-energy electron streaking spectroscopy.The Supporting Information is available free of charge at https://pubs.acs.org/doi/10.1021/acsphotonics.1c00775.Single-crystalline gold tapers; Pasmonic nanoresonator; Electron detection and data handling; Spatial resolution; Local kinetic energy distribution; Temporal resolution; Simulation (PDF)This article has not yet been cited by other publications.

physics, condensed matter,optics, applied,materials science, multidisciplinary,nanoscience & nanotechnology

What problem does this paper attempt to address?

The problem this paper attempts to address is: how to use low-energy point projection electron microscopy (UPEM) to detect transient local electromagnetic fields and characterize the spatial and temporal properties of vector near-fields in individual nanostructures.

Specifically, the paper focuses on the following aspects:

1. **Interaction between low-energy electrons and transient electromagnetic fields**: Investigating the interaction of low-energy electrons with transient local electromagnetic fields in ultrafast point projection electron microscopy, particularly by analyzing the kinetic energy distribution of electrons to distinguish angular deflection caused by radial field components and energy gain or loss caused by axial acceleration.

2. **Improving spatial and temporal resolution**: Enhancing the spatial and temporal resolution of ultrafast low-energy electron microscopy by combining nano-tip photoemitters and point projection imaging schemes, thereby enabling the detection of ultrafast dynamic processes in individual nanostructures.

3. **Spatiotemporal characterization of vector near-fields**: Utilizing time-resolved pump-probe experiments with low-energy electrons to achieve spatiotemporal characterization of vector near-fields in individual small nanostructures by recording the three-dimensional momentum distribution of scattered electrons.

The paper validates the effectiveness of these methods through experiments and simulations, demonstrating the potential of low-energy electrons in probing nanoscale dynamic processes.