Abstract:The silver halide material is a very important optical information material. Silver halide material plays a very imperative role in the development of the information science and technology. The time characters of the photon action process determine the quality of the silver halide material to a great degree. We adopt the microwave absorption technology to measure the time characters of the process of the photon acting on silver halide material. A sample of the silver halide material is inserted into a microwave resonant cavity. With the excitation of excimer laser, photogenerated charge carriers are created in the silver halide material. The generation of the photogenerated charge carriers changes the dielectric function of the silver halide material. Therefore, the change of the dielectric function embodies the information of the time characters of the photogenerated change carries. At the same time, the change of the dielectric function results in an alteration of the cavity quality factor. This change leads to a reflected microwave. The reflected microwave contains the information of the time characters of the photon action process. Through the measurement of the reflected microwave, we can obtain the time resolution spectrum of the process of the photon acting on the silver halide material and study the time characters of the photon action process. The time resolution spectra of the process of the photon acting on various silver halide materials were obtained in our experiments. We analyzed the time characters of photon acting on the black-and-white film, color film and X-ray film.

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