New Design of Upper Waveguide with Unintentionally Doped InGaN Layer for InGaN-based Laser Diode
Feng Liang,Degang Zhao,Desheng Jiang,Zongshun Liu,Jianjun Zhu,Ping Chen,Jing Yang,Wei Liu,Xiang Li,Shuangtao Liu,Yao Xing,Liqun Zhang,Heng Long,Mo Li
DOI: https://doi.org/10.1016/j.optlastec.2017.07.012
IF: 4.939
2017-01-01
Optics & Laser Technology
Abstract:The optical and electrical characteristics of one new laser structure have been theoretically investigated, in which an unintentionally doped InGaN layer (u-InGaN) located between the last quantum barrier and the electron blocking layer is designed as the upper waveguide (UWG). It is found that this unintentionally doped InGaN layer is benefitted to achieve a low threshold current and larger output power due to a good optical field distribution and effective blockage of electron leakage. Meanwhile, according to the systematically analysis on the influence of indium content, background concentration and layer thickness, 100 nm In0.02Ga0.98N UWG with 1 x 10(17) cm(-3) background concentration is suitable for the new laser structure. (C) 2017 Elsevier Ltd. All rights reserved.