Experimental Investigation of Fundamentals of Negative Capacitance FETs

Genquan Han,Jiuren Zhou,Yan Liu,Jing Li,Yue Peng,Yue Hao
DOI: https://doi.org/10.1109/S3S.2018.8640179
2018-01-01
Abstract:In this paper, the experimental investigation of fundamentals of negative capacitance FETs is reported. It is revealed that: 1) internal voltage amplification effect induced by negative capacitance effect contributes to the boosted electrical performance; 2) hysteresis-free operation, besides the enhancement in electrical performance is directly determined by the capacitance matching; 3) at high frequency case, metal-ferroelectric-insulator-semiconductor (MFIS) structure NCFETs show better electrical performance over metal-ferroelectric-metal-insulator-semiconductor (MFMIS) structure device.
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