Fast Thermal Sensor Allocation Algorithms for Overheating Detection of Real Microprocessors

Xin Li,Xueting Wei,Zhemin Duan
DOI: https://doi.org/10.1109/iecon.2017.8216601
2017-01-01
Abstract:High-performance processors utilize embedded thermal sensors to continuously monitor the temperature of the chip during runtime. However, the overheating locations change temporally and spatially, depending on the various workloads running on the chip. Moreover, on-chip thermal sensor readings are highly affected by noise due to fabrication variations and randomness, which make the task of thermal monitoring particularly challenging. In this paper, we establish overheating detection models to address the thermal sensor allocation problem under two different conditions, when the on-chip thermal sensor observations are corrupted by noise. On this basis, a heuristic method based on genetic algorithm (GA) is proposed to find a near-optimal thermal sensor allocation solution that can significantly improve overheating detection probability, while greatly reducing execution time. We also propose a hybrid algorithm to identify the optimal thermal sensor placement for each individual chip block or component. Furthermore, we develop an oil-based cooling system, and utilize infrared thermal imaging techniques to capture the thermal traces of a real dual-core microprocessor running on various workloads. Experimental results demonstrate that our proposed thermal sensor allocation algorithms clearly outperform several common allocation approaches in terms of overheating detection, which can provide accurate and reliable thermal monitoring.
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