Energy Transport Model for Base Transit Time of Ultrathin Base SiGe HBT's

CAI Rui-ren,LI Yao,LIU Rong-kan
DOI: https://doi.org/10.3969/j.issn.1004-3365.2006.05.021
IF: 1.992
2006-01-01
Microelectronics Journal
Abstract:By solving Boltzmann energy transport equation,the electron temperature distribution in the base region was obtained,and a model for base transit time of ultra-thin base SiGe HBT's was developed with electron temperature distribution taken into consideration.This model takes into account the effect of electron temperature on mobility,bandgap narrowing due to heavy doping in base region and the Ge concentration,and carrier velocity saturation in the BC junction. Comparisons were made on cut-off frequencies between predictions of this model and simulation results from the drift diffusion model to demonstrate the utility and accuracy of the model.
What problem does this paper attempt to address?