Delay‐locked Loop Based Clock and Data Recovery with Wide Operating Range and Low Jitter in a 65‐nm CMOS Process

Yuan Wang,Yuequan Liu,Song Jia,Xing Zhang
DOI: https://doi.org/10.1002/cta.2267
IF: 2.378
2016-01-01
International Journal of Circuit Theory and Applications
Abstract:SummaryA delay‐locked loop (DLL) based clock and data recovery (CDR) circuit with a half‐rate clock is proposed. The CDR includes a coarse and a fine tuned block, in which the novel coarse and fine phase detectors form closed loops. It is designed in a 65‐nm complementary metal‐oxide semiconductor (CMOS) process using a 1.2‐V supply voltage. The simulation results show that it can cover a wide operating range from 500 Mbps to 8 Gbps and the corresponding peak‐to‐peak jitters are 1.63 ps and 0.96 ps, respectively. Copyright © 2016 John Wiley & Sons, Ltd.
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