Voltage Ratio Traceability of 10 Kv Low-Voltage Excited Two-Stage Voltage Transformer

Huanghui Zhang,Haiming Shao,Jiafu Wang,Wei Wang,Feipeng Lin,Tianyu Sun,Wei Zhao,Chuansheng Li,Yiqian Wu
DOI: https://doi.org/10.1109/tim.2017.2662559
IF: 5.6
2017-01-01
IEEE Transactions on Instrumentation and Measurement
Abstract:To establish a series of ppm-level high-voltage ratio standards up to 110 kV, we propose and have designed lowvoltage-excitation two-stage voltage transformers (LVE-TSVTs) for high voltage. Ratio traceability for a 10 kV/100 V LVE-TSVT is vital in this scheme. This paper focuses on the voltage ratio traceability of the 10 kV LVE-TSVT by measuring the errors of the reference voltage and the voltage coefficient separately. A 1 kV double-TSVT with a 1 kV/100 V TSVT and a 100 V/10 V TSVT in cascade was developed and calibrated, and then was used to calibrate the error of the 10-kV LVE-TSVT at 10% rated voltage. The voltage coefficient was measured by comparing with a high-voltage capacitive divider through a current comparator bridge. The measurement was implemented in the range of 10%-120% rated voltage. The calibration results showed that the ratio errors of the 10-kV LVE-TSVT were less than 0.95x10(-6) in magnitude and -1.26 mu rad in phase displacement at the 10% rated voltage. The expanded uncertainties are about 1.8 x 10(-6) in ratio and 2.2 mu rad in phase, respectively, with coverage factor k = 2.
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