Life Test and Failure Mechanism Analyses for High-power LED

ZHENG Dai-shun,QIAN Ke-yuan,LUO Yi

DOI: https://doi.org/10.3969/j.issn.1001-5868.2005.02.002

2005-01-01

Abstract:High-power blue light -e mitting diodes were fabricated with the blue LED chips as primary light source,a nd high-power white LEDs were fabricated by phosphor conversion.Life of high-p ower blue and white LEDs was measured,and the failure mechanism was investigated . Results show that the light output of LEDs degrades exponentially with the tim e,the growth of defects and formation of nonradiative recombination centers, qua ntum efficiency reduction of phosphor, the destroy of static electricity, breaka ge of metallization layer and solder instability for flip-chip, and mechanical stress within the LED package caused by the variations in ambient temperature an d self-heating,and so on,will result in the failure for high-power LEDs.