Abstract:The high-precision characterization of the intra-pixel sensitivity (IPS) for infrared focal plane array (FPA) photodetector is of great significance to high-precision photometry and astrometry in astronomy, as well as target tracking in under-sampled remote sensing images. The discrete sub-pixel response (DSPR) model and fill factor model have been used for IPS characterization in some studies. However, these models are incomplete and lack the description of physical process of charge diffusion and capacitance coupling, leading to the inaccuracy of IPS characterization. In this paper, we propose an improved IPS characterization method based on the diffusion and coupling physical (DCP) model for infrared FPA photodetector, which considering the processes of generation and collection of the charge, can improve the accuracy of IPS characterization. The IPS model can be obtained by convolving the ideal rectangular response function with the charge diffusion function and the capacitive coupling function. Then, the IPS model is convolved with the beam spot profile to obtain the beam spot scanning response model. Finally, we calculate the parameters of IPS by fitting the beam spot scanning response map with the proposed DCP model based on the Trust-Region-Reflective algorithm. Simulated results show that when using a 3 μm beam spot to scan, the error of IPS characterization based on DCP model is 0.63%, which is better than that of DSPR model’s 3.70%. Experimental results show that the fitting error of the beam spot scan response model based on DCP model is 4.29%, which is better than that of DSPR model’s 8.31%.

Accurate measurement of high resolution spectrum obtained by F–P etalon and ICCD

Processing method of spectral measurement using F-P etalon and ICCD.

Accurate assessment of f′1 value of fine photometer heads

Fast and High-Accuracy Spectral Measurements of LED by Linear CCD Sensor and Software Calibration

Experimental Analysis on the Rapid Measurement of a High Precision Brillouin Scattering Spectrum in Water Using a Fabry–Pérot Etalon

Experimental Analysis On Calibration Of Instrument Broadening In A Lidar System With Fabry-Perot Etalon

Accurate calculation of the spacing of F-P etalon under the multi-wavelength weighted regression

Measurement Accuracy Improvement With Pzt Scanning For Detection Of Dpc In Hi-Bi Fibers

Submicron Displacement Measurement Method Based on Fabry-Perot Etalon

A Method of Measuring Fabry-Parot Etalon Transmittance by Using Frequency Comb Laser

A Method of Measuring FP Transmittance Based on Whispering Gallery Mode Light Source

Improved Intra-Pixel Sensitivity Characterization Based on Diffusion and Coupling Model for Infrared Focal Plane Array Photodetector

Ultra-high-resolution spectral measurement method and system

The error analysis and experimental research of micro-angle measurement system based on F-P etalon

Calibration of FP Etalon Transmittance Curve and Wind Field Observation Based on Doppler Wind Measurement Lidar

Analysis of high-resolution spectra from a hybrid interferometric/dispersive spectrometer

High-accuracy Direction Measurement and High-resolution Computational Spectral Reconstruction Based on Photonic Crystal Array

Fiber-coupled Chromatic Confocal 3D Measurement System and Comparative Study of Spectral Data Processing Algorithms

Study on Spectral Calibration of an Ultraviolet Fourier Transform Imaging Spectrometer with High Precision

Fabry–Pérot based short pulsed laser linewidth measurement with enhanced spectral resolution

Echelle and Etalon Used for Spectral Metrology of Excimer Laser Lithographic Light Sources at 193Nm