Accurate calculation of the spacing of F-P etalon under the multi-wavelength weighted regression

Songjiang Liu,Ying Chang,Zhigang Xiao,Henian Zhu

DOI: https://doi.org/10.3969/j.issn.1007-2276.2011.03.031

2011-01-01

Abstract:A set of interference concentric circles was formed when monochromatic light illuminated the F-P etalon. The relation of interference orders and the square of the diameters of interference circles was known in the first-order approximation. The fractional order at the centre of the interference fringes was determined by the revised quasi-linear equation in which the second-order term was added. The multi-spectral light source consisted of four similar yellow wavelengths, such as two Hg, one He and one Ne. The image of interference concentric circles was obtained by digital camera at the focal plane of lens simultaneously. The diameters and standard deviations were computed by the circular regression of coordinate data. The fractional order was calculated by a new quasi-linear weighted regression model, and the expanded uncertainties were solved corresponding to different wavelengths. Inducing three wavelengths to the process of excess fraction method, which was composed of two Hg and one He spectra, the integer interval and the fractional ranges could be confirmed under the condition that the estimated spacer of the F-P etalon was measured. The experimental results show that if the calculating step is less than 0.01 nm, the spacer d of the F-P etalon is 1 655.33167 ± 0.00045 μm, and the relative error limit is not more than 3 × 10-7. Tested by the Ne spectrum, the relative deviation between the calculated and measured values of the interference order is 1.9 × 10-7 through the measured value of d, which is significantly less than the relative uncertainty of the measurements value of 7.4 × 10-7.