Abstract:Although there are various methods to measure the modulation transfer function (MTF) of charge-coupled devices (CCD). the interferometric fringe pattern method has advantages over others, such as canted slit sources, bar targets, knife-edge, laser-speckle patterns, random noise pattern, etc. Our interferometric method is relatively simple and versatile: It requires no critical optics and no focusing or precision alignment, the entry array is tested, the contrast ratio of the test pattern is high enough, the spatial frequency of the fringe pattern can vary continuously. Our method generates the formation of a sinusoidal intensity fringe pattern by the interference of two monochromatic plane waves, and straightforward projects it onto the CCD array under test. The construction of the experimental device is based on the Fresnel Double-Mirror structure. A 2.5 mw He-Ne laser with the wavelength of 632.8 nm is used as the light source, the laser beam is spatially filtered by a 10 mu m pinhole and expanded to a diameter of 30 mm, and the resulting wave front is divided by two mirrors, which incline to each other at a small angle, and interfered. One of the mirrors is rotatable to vary the frequency of the pattern. The CCD array is mounted on a stage, which is also rotatable to make that the CCD array takes different angle with the fringe pattern direction, to receive the patterns. With the method we provided, the spatial frequency can be extended to some 2 times the Nyquist frequency of the CCD array to study the aliasing effect. In the Cartesian coordinates, the x- and y- axis MTFs (at angle 0 degrees and 90 degrees) of the CCD array were measured, the other three MTFs (at angle 26.56 degrees, 45 degrees and 63.44 degrees), which nobody has done before, were also tested offering a more comprehensive characterization of the CCD array.

Processing method of spectral measurement using F-P etalon and ICCD.

Accurate measurement of high resolution spectrum obtained by F–P etalon and ICCD

Simple Fringe Illumination Technique for Optical Superresolution

Modulation transfer function measurement of charge-coupled devices using frequency-variable fringe patterns

Accurate calculation of the spacing of F-P etalon under the multi-wavelength weighted regression

Experimental Analysis on the Rapid Measurement of a High Precision Brillouin Scattering Spectrum in Water Using a Fabry–Pérot Etalon

Submicron Displacement Measurement Method Based on Fabry-Perot Etalon

Real-Time Image-Processing Of F-P Interference Fringe Pattern

Measurement Accuracy Improvement With Pzt Scanning For Detection Of Dpc In Hi-Bi Fibers

Fabry–Pérot based short pulsed laser linewidth measurement with enhanced spectral resolution

Improved Dual-Frequency On-Line Phase Measuring Profilometry Based On Full-Cycle Equal Phase-Shift Algorithm

Fabry–Perot Interferometer with Picometer Resolution Referenced to an Optical Frequency Comb

Recent Developments of Interferometric Wavefront Sensing

Signal Processing of White-Light Interferometric Low-Finesse Fiber-Optic Fabry-Perot Sensors

Ultrahigh-speed phase demodulation of a Fabry–Perot sensor based on fiber array parallel spectral detection

High-resolution and large dynamic range fiber extrinsic Fabry–Perot sensing by multi-extrema-tracing technique

Experimental Analysis On Calibration Of Instrument Broadening In A Lidar System With Fabry-Perot Etalon

EFPI Demodulation Algorithm Based on the Combination of Nuttall Convolution Window and Discrete Gap Transformation

Parallel Cross-Correlation Algorithm for the Fast Interrogation of High-Finesse Fiber-Optic Fabry-Perot Sensors

Decoding the Spectra of Low-Finesse Extrinsic Optical Fiber Fabry-Perot Interferometers.

A Method for Suppressing Saturation-Induced Errors in Fringe Projection Profilometry by Fringe Restoration Assisted via Euler Formula-Based Method and Intersection Points