In(AsN) Mid-Infrared Emission Enhanced by Rapid Thermal Annealing

M. Kesaria,S. Birindelli,A. V. Velichko,Q. D. Zhuang,A. Patane,M. Capizzi,A. Krier
DOI: https://doi.org/10.1016/j.infrared.2014.11.016
IF: 2.997
2014-01-01
Infrared Physics & Technology
Abstract:We report a substantial increase in the quality and photoluminescence (PL) emission efficiency of In(AsN) dilute nitride alloys grown on both p-type InAs and semi-insulting GaAs substrates, in response to rapid thermal annealing. At 4 K the PL emission efficiency increases by 25 times due to a reduction in non-radiative Shockley-Read-Hall recombination originating from elimination of point defects. For annealing temperatures up to 500 degrees C the activation energy for thermal quenching increases by a factor of three, with no change in the residual electron concentration and mobility. Temperature dependent PL, together with X-ray diffraction measurements, reveals an improvement in compositional uniformity. Our results are significant for photonic device applications and particularly for the development of cryogenic mid-infrared photodiodes, monolithic detectors and focal plane arrays. (C) 2014 Elsevier B.V. All rights reserved.
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