The Effective Range of K-Fault Diagnosis of Linear Circuits

Yao Wu,Shi Bai Tong
DOI: https://doi.org/10.1007/bf02778421
1990-01-01
Abstract:In view of K-fault testability,the topological construction of a practical circuitis far from ideal.In order to improve the testability of a circuit,we may increase the numberof accessible nodes or use the multi-excitation method.Effectiveness of these methods and thefeasibility of choosing accessible nodes are discussed in detail.The conditions for multi-excitationtestability are presented.
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