Abstract:Ensuring user safety has become increasingly essential, especially for safety-critical systems (SCSs) that are vital to human life or significant property. However, the prevailing design-for-testability (DFT) model, which relies on dependencies, overlooks safety-related faults and lacks adequate metrics for evaluating system safety. Consequently, the current dependency model is insufficient in effectively assessing system safety. To address this issue, this study has developed a comprehensive DFT model that integrates system safety considerations, known as the safety-related fault model (SRFM). SRFM uses internal block diagrams (IBDs) as a means, employs a nine-tuple model to create a static automatic fault tree, and establishes mapping relationships. Sensitivity analysis is utilized to quantify system safety factors, resulting in a safety-related dependency matrix. Two crucial concepts, design safety sensitivity (DSS) and theoretical safety sensitivity (TSS), are introduced to quantify system safety loss after a fault occurs. Additionally, two new safety-related testability metrics—test advantage of safety assessment on probability (TASAP) and test advantage of safety assessment on number (TASAN)—are developed for a robust evaluation of system safety. To validate the effectiveness of SRFM, it is applied to an electronic safety and arming device (ESA), demonstrating superior performance in TASAP and TASAN compared to existing models, with a negligible impact on expected test cost (ETC).

Board-level Functional Test Selection Based on Fault Tree Analysis

Functional Test-Cost Reduction Based on Fault Tree Analysis and Binary Optimization

Testability design based on relevance of circuit nodes and fault diagnosis

Test Point Selection Method for Hierarchical Fault Diagnosis

Built-in Test Diagnosis Strategy Design for Fault-tolerant System Based on Dynamic Fault Tree Analysis

Test Points Selection for Analog Fault Dictionary Techniques

Entropy Based Test Point Evaluation and Selection Method for Analog Circuit Fault Diagnosis

Joint Distribution-Based Test Selection for Fault Detection and Isolation Under Multiple Faults Condition

Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances

Conditional Joint Distribution-Based Test Selection for Fault Detection and Isolation

Selection of Global Minimal Test Points Set for Integer-Coded Fault Wise Table

Boundary Value Testing Using Integrated Circuit Fault Detection Rule

Method of diagnostic tree design for system-level faults based on dependency matrix and fault tree

Reliability analysis of complex dynamic fault trees based on an adapted KD Heidtmann algorithm

Research on Modeling Method of Testability Design Based on Static Automatic Fault Tree

Design of Test Points Selection and Test Sequencing Problem of Multivalued Fault Dictionary

New fault diagnosis method for analog circuit using network tree

Novel Testability Modelling and Diagnosis Method Considering the Supporting Relation Between Faults and Tests

A New Test Point Selection Method for Analog Continuous Parameter Fault

METHOD TO ANALYZING SOFTWARE TESTABILITY AFFECTING FACTORS BASED ON TESTABILITY TREE

Simplified Entropy and Multidimensional Search for Test Points Selection