Abstract:Science Progress, Volume 107, Issue 4, October-December 2024. The complexity of test and fault information within electronic devices makes their integrated diagnosis a challenging problem when designing equipment reliability. Current integrated diagnosis is analyzed for test optimization and test resource optimization. However, this neglects the connection between them. This paper proposes a design strategy for integrated diagnosis optimization based on the spatial mapping principle to quantitatively describe the constraint relationship between them. The integrated diagnosis optimization model is established by constructing the logical mapping relationship between test space, resource space, and fault space, and the optimal test configuration and test resource configuration are sought based on the grey wolf optimization algorithm. Seven high-dimensional benchmark functions and an integrated diagnosis model of electronic equipment are used to verify the efficiency of the algorithm proposed in this paper. The proposed algorithm is compared with the other four in terms of the algorithm's optimization speed and accuracy. The results indicate that the electronic equipment after integrated diagnosis optimization has critical fault detection, fault detection, fault isolation, and false alarm rates of 100%, 99.99%, 98.99%, and 0.2993%, respectively. After the integrated diagnosis optimization, the number of tests of the equipment is reduced by 88.9%, and the test cost is saved by 89%. Compared with the other algorithms, grey wolf optimization achieves the best optimization results, reduces the number of tests by 42%–55%, and decreases the test cost by 77.63%–83.91%. This strategy not only considers the test optimization of equipment and test resources optimization but also dramatically reduces the test cost while improving the test efficiency.

Functional Test-Cost Reduction Based on Fault Tree Analysis and Binary Optimization

ANALYZE OF FUNCTIONAL REGRESSION TEST TOOLS

Functional Test-Cost Reduction Based on Optimization Modeling and Congestion Control

Board-level Functional Test Selection Based on Fault Tree Analysis

An Improved Test Selection Optimization Model Based on Fault Ambiguity Group Isolation and Chaotic Discrete PSO.

Study on Fault-Tolerant Based on Modular Method in the Development of Test and Control System Software

A Markov Decision Approach to Optimize Testing Profile in Software Testing

Software Reliability Modeling and Cost Estimation Incorporating Testing-Effort and Efficiency

Modelling and Optimizing Motherboard Functional Testing in Laptop Manufacturing

Optimal resource allocation for cost and reliability of modular software systems in the testing phase

Reliability-Based and Cost-Oriented Product Optimization Integrating Fuzzy Reasoning Petri Nets, Interval Expert Evaluation and Cultural-Based DMOPSO Using Crowding Distance Sorting

Optimizing design method of operational profile in statistical testing

A scan chain optimization method for diagnosis

A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost

Integrated diagnosis optimization design of the electronic equipment based on spatial mapping

Design of reliable systems using static and dynamic fault trees

Integrated Optimization of Test Case Selection and Sequencing for Reliability Testing of the Mainboard of Internet Backbone Routers

Analysis of Software Reliability Modeling Considering Testing Compression Factor and Failure-to-Fault Relationship.

Optimizing the Efficiency of Accelerated Reliability Testing for the Internet Router Motherboard

A Novel Hybrid Delay Testing Scheme with Low Test Power, Volume, and Time

Optimization Model-Based Reliability Assessment for Distribution Networks Considering Detailed Placement of Circuit Breakers and Switches