Abstract:The transport of the available charge carriers is a key issue to determine the macroscopic behaviors of insulating materials. Although the rapid developments of experimental and numerical techniques make great contributions to the understanding of the space charge dynamics, the charge carrier mobility and the nature of traps in various situations of electric field and temperature in polymeric materials, the relationship between the insulation failure and the charge transport still remains unclear. As a result, the way continues to further understand the links, particularly in the view of traps. This paper indeed focuses on these significant links and describes the effective methods to improve insulation properties based on the links. The short-term insulation failure including the breakdown and surface flashover, and the significant methods such as employment of nanostructured fillers and surface treatments of polymers, are discussed. Considering the characteristics of charge capture, the effect of trap filling and the numerical techniques with high precision, the charge transport behaviors in polymers are investigated based on surface potential decay (SPD) and bipolar charge transport (BCT) models. The deep trap can effectively reduce carrier mean free path and the energy obtained from applied field. Consequently, the breakdown strength increases as an increase of deep trap. The deep trap can effectively reduce charge mobility and then the conductivity. The trap sites, especially for deep traps, can be modified by employing nanostructured fillers and surface treatments. These modifications can influence the charge injection, the impact ionization within the low-density regions, and the flashover development processes. In this way, electrical breakdown strength and surface flash over performance are improved.

The Effect Of Static And Dynamic Parasitic Charge In The Termination Area Of High Voltage Devices And Possible Solutions

Suppression of Parasitic Jfet Effect in Trench Igbts by Using A Self-Aligned P Base Process

Theoretical Study of an Effective Field Plate Termination for SiC Devices Based on High-k Dielectrics

Effects of Non-Fatal Electrostatic Discharge on the Threshold Voltage Degradation in Nano CMOS Devices

Ultra-high voltage device termination using the 3D RESURF (super-junction) concept - experimental demonstration at 6.5 kV

Design and Analysis of an Area-Efficient High Holding Voltage ESD Protection Device

Preventing Space Charge Induced Breakdown Using Electrets at Various Temperatures

The Effect of PD Process on the Accumulation of Surface Charges

A Novel Simulation of Space Charge Decay Dynamics after Removing the Voltage in Epoxy Resin Composites

Deep Trench Junction Termination Employing Variable-K Dielectric For High Voltage Devices

Surface engineering and on-site charge neutralization for the regulation of contact electrification

Effect of Insulation Barrier on AC Breakdown Voltage of Rod-Plane Gaps and Analysis of Surface Residual Charge Property

A novel simulation of space charge decay dynamics after removing voltage in epoxy resin composites

Cavity and Interface Effect of PI-Film on Charge Accumulation and PD Activity under Bipolar Pulse Voltage

Interface Tailoring for Charge Injection Control in Polyethylene

Phase field study on electrical treeing under combined AC/DC voltage based on bipolar barrier transfer model

Interface Tailoring For Charge Injection Mitigation In Insulators: Different Principles And Achievements

Dynamic Balancing between Thermal -Field Emission Currents of Series-connected Vacuum Gaps

The Effect and Dynamic Behavior of Particles in High-Current Vacuum Arc Interruptions

Charge Dynamics: Linking Traps To Insulation Failure

Numerical Analysis on Space Charge and AC-DC Combined Breakdown Strength in Polyethylene