A New System-on-a-chip (SOC) Technology High Q Post Passivation Inductors

MS Lin,L Chen,JY Lee,KH Wan,HM Chen,K Chou,R Hsiao,E Lin
DOI: https://doi.org/10.1109/ectc.2003.1216495
2003-01-01
Abstract:This paper presents a new SOC scheme by adding high Q (>15) inductors on top of IC passivation layer. Affiliated with such a high Q inductor, a high performance RF CMOS chip can he achieved, which may replace some applications of GaAs chips. The high Q value of the inductor is attributed to the large gap formed by the thick polyimide located hetween the inductor body and IC passivation layer, as well as the thick metal traces of inductors. Conventional IC front-end process technology cannot offer these advantages as it places the inductor closer to the silicon substrate, and its metal is thinner than 2 p m. The manufacturing cost of post-passivation inductor is also much lower than that of font-end IC process in that the post passivation inductors can he fabricated in a more relaxed manufacturing environment Two kinds of inductor bodies, copper and gold, have been developed, respectively. At 5 GHz, the post passivation inductor demonstrated a Q factor as high as 24, which is much greater than that of the ones formed by IC front-end process that are positioned under the passivation layer (Q value lower than 10). The reliability results of the new SOC scheme will he also presented.
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