High-Q Integrated Inductor Using Post-Cmos Selectively Grown Porous Silicon (sgps) Technique for Rfic Applications

Chen Li,Huailin Liao,Chuan Wang,Jun Yin,Ru Huang
DOI: https://doi.org/10.1109/led.2007.901682
IF: 1.916
2007-01-01
Solid-State Electronics
Abstract:This paper reports a new category of high-Q integrated inductor which is realized using post-CMOS selective grown porous silicon (SGPS) technique. The SGPS technique is used to effectively reduce low-resistivity silicon substrate loss. Different from other porous silicon (PS) based inductor techniques, this SGPS technique is completely post-CMOS based. The inductors are fabricated in standard RF CMOS process firstly and then Q-factors are improved through our proposed post-CMOS SGPS technique. For a 2.1nH inductor fabricated in a standard 0.35 mu m RF CMOS process, a 105% increase (from 9.5 to 19.4) in peak Q factor is obtained. Furthermore, a 2.45 GHz VCO using proposed SGPS inductor achieves 7.2dBc phase noise improvement at 100 kHz frequency offset.
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