The Influence of Preparing Condition on the Structure and Soft Magnetism of Fe-Ta-N Films

Bin MA,De-fang SHEN,Guo-qing Di,Zheng YANG,Fu-lin WEI
DOI: https://doi.org/10.3969/j.issn.1001-3830.2001.02.001
2001-01-01
Abstract:Fe-Ta-N films were prepared by RF magnetron sputtering. The dependence of structure and magnetic properties on fabrication condition were researched systematically. At first, the films with different Ta content are prepared. It is found that (Fe89.5Ta10.5)-N films have good soft magnetic properties at large range of nitrogen partial pressure. The addition of Ta holds back the formation of iron-nitride, so the films have high saturation magnetization, Ms=1242kA/m.Next, the influence of annealing temperature on the structure and soft magnetic properties of (Fe89.5Ta10.5)-N films is researched. At P(N2)=5%, the as-deposited film is amorphous, coercivity is large. After annealing, the film crystallizes, coercivity decreases greatly, and the ratio of crystalline is 40% after annealing at 400℃. At last, the influence of sputtering power and total pressure is researched. It is found that the magnetic properties are not sensitive to them. It indicated that the film is an optimum head material for industry.
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