A Micromachined Scanning Fabry-Perot Interferometer

PM Zavracky,KL Denis,HK Xie,T Wester,P Kelley
DOI: https://doi.org/10.1117/12.323885
1998-01-01
Abstract:In this talk, a micromachined scanning Fabry-Perot interferometer (FPI) employing electrostatic actuators and tuned to the visible spectrum is described. Previous authors have demonstrated micromachined Fabry-Perot devices. The FPI described here offers a simpler process flow and a broader tuning range. The FPI is constructed by separately fabricating a MEMS actuator and semi-transparent optical mirrors. These are then assembled to complete the device. The competed device consists of two plane parallel mirrors separated by a small gap (<1 mu m). The gap is formed by a sacrifical layer which is etched away to free the gold beams. Devices have been fabricated using single layer aluminum mirrors. Modeling results of devices incorporating dielectric multi-layer stacks will. be discussed. Present devices are suitable for scanning the entire visible region of the spectrum 450-750nm Actuating voltages of approximately 60V are required. Devices fabricated with aluminum mirrors have resolving powers of up to 50. Proposed applications include in situ measurements of plasma composition, colorimetric, and chemical analysis.
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