The Design Of An Improved Low-Power Voltage Testing And Protection Circuit

Nl Wang,S Zhang,Rd Zhou
DOI: https://doi.org/10.1109/ICASIC.2003.1277603
2003-01-01
Abstract:This paper presents the design of an improved low-power and high-precision voltage testing and protection circuit, which is most suitable for the IC cards. The circuit consists of a temperature-insensitive low voltage testing part and high voltage protection part, which assures that the IC cards can work in a certain voltage range and avoid being destroyed by the high voltage. The simulation results of the circuit are correctly in consistence with the design objects.
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