A Simplified High-Speed Bipolar Process with Ti Salicide Metallization: Implementation of in Situ P-Doped Polysilicon Emitter

W Kaplan,J Pejnefors,M Linder,M Sanden,TE Karlin,G Malm,SL Zhang,JV Grahn,M Ostling
DOI: https://doi.org/10.1238/physica.topical.079a00318
1999-01-01
Physica Scripta
Abstract:A simplified double-polysilicon bipolar process utilizing only four photolithography steps has been developed. The process features full self-alignment of emitter-base module and titanium self-aligned silicide metallization. The simplified process has been used as a test vehicle in implementation of an in situ phosphorus doped polysilicon technology. The base and collector currents demonstrated nearly ideal behavior in the Gummel plot resulting in high common-emitter current gain around 200. High-frequency measurements revealed a peak cut-off frequency of 9 GHz measured directly on the silicide. The results from the simplified process have been shown to be directly transferable to a full-scale bipolar technology.
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