Observation of the Charged Defect Migration That Causes the Degradation of Double-Schottky Barriers Using a Nondestructive Quantitative Profiling Technique

Chenlu Cheng,Jinliang He,Jun Hu
DOI: https://doi.org/10.1063/1.4897152
IF: 4
2014-01-01
Applied Physics Letters
Abstract:The migration and neutralization of charged defect ions during the degradation of a double-Schottky barrier are observed by performing nondestructive pulsed electroacoustic measurements on ZnO bicrystals. This offers the possibility to experimentally access the predicted defect migration behavior and provides a solid foundation to validate the theoretical aging model for electroceramics. Theoretical modeling of the acoustic attenuation effects during measurements is also discussed to understand and validate the experimental results, gaining insight into the widely used acoustic technique.
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