Characterization of dielectric behavior in ZnO electroceramic: Superior grain boundary, inferior grain boundary and grain

chenlu cheng,jun hu,jinliang he
DOI: https://doi.org/10.1016/j.matlet.2014.06.100
IF: 3
2014-01-01
Materials Letters
Abstract:Delicately fabricated ZnO bicrystals of varying nonlinearity, along with as-grown ZnO single crystal, are investigated by broadband dielectric spectroscopy to reveal the rate process involved in individual grain boundary and grain of ZnO electroceramics. Two types of low frequency dispersion phenomena, originating from the transport across the interface of double-Schottky barrier, present in individual grain boundaries. Investigation on the temperature dependence of loss peak frequency of bicrystal samples which obeys the Arrhenius law reveals that intrinsic donor species Zni• and Zni•• may contribute to the occurrence of loss peaks.
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