An analytic approach to the degradation of double-Schottky barrier: Theoretical prediction of V O 0 –Zn i 2+ :Zn i 2+ as dominant mobile ion in ZnO electroceramic

jinliang he,chenlu cheng,jun hu
DOI: https://doi.org/10.1016/j.scriptamat.2015.03.019
IF: 6.302
2015-01-01
Scripta Materialia
Abstract:An analytic approach, aimed at characterizing the degradation properties of the double-Schottky barrier formed at the grain boundary in various electroceramics, is exhaustively described. Migration and neutralization behavior of charged defect ions is portrayed during the degradation of electrostatic potential under electrical stress. By comparing simulation results with experimental data from the aging test performed on fabricated [0 0 0 1] ZnO bicrystals, Zn-i(2+) from V-O(0)-Zn-i(2+) complex donor defect is identified as the optimum candidate for the mobile ion responsible for degradation phenomena of ZnO electroceramics. (C) 2015 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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