Electrical Degradation of Double-Schottky Barrier in ZnO Varistors

Jinliang He,Chenlu Cheng,Jun Hu
DOI: https://doi.org/10.1063/1.4944485
IF: 1.697
2016-01-01
AIP Advances
Abstract:Researches on electrical degradation of double-Schottky barrier in ZnO varistors are reviewed, aimed at the constitution of a full picture of universal degradation mechanism within the perspective of defect. Recent advances in study of ZnO materials by atomic-scale first-principles calculations are partly included and discussed, which brings to our attention distinct cognition on the native point defects and their profound impact on degradation.
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