Thermal-Stability of Coevaporated Al-Pt Thin-Films on Gaas Substrates

B BLANPAIN,GD WILK,JO OLOWOLAFE,JW MAYER,LR ZHENG
DOI: https://doi.org/10.1063/1.103671
IF: 4
1990-01-01
Applied Physics Letters
Abstract:We report on the stability of Al-Pt coevaporated thin films on GaAs substrates for aluminum concentrations ranging from 45 to 70 at. %. We show that for the region with compositions between AlPt and Al2Pt these alloy thin films fulfill the thermal stability requirements imposed by GaAs self-aligned gate technology.
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