Sub-band Transport Mechanism and Switching Properties for Resistive Switching Nonvolatile Memories with Structure of Silver/aluminum Oxide/p-Type Silicon

Yanhong Liu,La Li,Song Wang,Ping Gao,Peng Zhou,Jinhua Li,Zhankun Weng,Lujun Pan,Jialiang Zhang
DOI: https://doi.org/10.1063/1.4908540
IF: 4
2015-01-01
Applied Physics Letters
Abstract:In this paper, we discuss a model of sub-band in resistive switching nonvolatile memories with a structure of silver/aluminum oxide/p-type silicon (Ag/AlxOy/p-Si), in which the sub-band is formed by overlapping of wave functions of electron-occupied oxygen vacancies in AlxOy layer deposited by atomic layer deposition technology. The switching processes exhibit the characteristics of the bipolarity, discreteness, and no need of forming process, all of which are discussed deeply based on the model of sub-band. The relationships between the SET voltages and distribution of trap levels are analyzed qualitatively. The semiconductor-like behaviors of ON-state resistance affirm the sub-band transport mechanism instead of the metal filament mechanism.
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