The Operation Cutoff Frequency of High Electron Mobility Transistor Measured by Terahertz Method

Y. M. Zhu,S. L. Zhuang
DOI: https://doi.org/10.1063/1.4887238
IF: 4
2014-01-01
Applied Physics Letters
Abstract:Commonly, the cutoff frequency of high electron mobility transistor (HEMT) can be measured by vector network analyzer (VNA), which can only measure the sample exactly in low frequency region. In this paper, we propose a method to evaluate the cutoff frequency of HEMT by terahertz (THz) technique. One example shows the cutoff frequency of our HEMT is measured at ∼95.30 GHz, which is reasonable agreement with that estimated by VNA. It is proved THz technology a potential candidate for the substitution of VNA for the measurement of high-speed devices even up to several THz.
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