Electroluminescence From The Sidewall Quantum Wells In The V-Shaped Pits Of Ingan Light Emitting Diodes

xiaoming wu,junlin liu,zhijue quan,chuanbing xiong,changda zheng,jianli zhang,qinghua mao,fengyi jiang
DOI: https://doi.org/10.1063/1.4880731
IF: 4
2014-01-01
Applied Physics Letters
Abstract:InGaN/GaN multi-quantum well (MQW) light emitting diodes with heavily Mg doped and unintentionally doped (UID) low-temperature Al0.2Ga0.8N electron blocking layer (EBL) were investigated. Broad short-wavelength electroluminescence peak, which has strong relative intensity to the main emission, was found in the UID-EBL sample at cryogenic temperatures. Study suggests that the broad peak is emitted by the sidewall MQWs. This result indicates that the electroluminescence of sidewall MQWs, in which the carrier density is high enough, can be detected at cryogenic temperatures. The lineshape variation with current density reveals detailed information on the process of carrier injection into the sidewall MQWs. (C) 2014 AIP Publishing LLC.
What problem does this paper attempt to address?