Phonon Polariton of InN Observed by Infrared Synchrotron Radiation

Takashi Inushima,Kazutoshi Fukui,Hai Lu,William J. Schaff
DOI: https://doi.org/10.1063/1.2918848
IF: 4
2008-01-01
Applied Physics Letters
Abstract:Temperature dependence of the reflectivity of InN with a carrier concentration of (3.5–4.7)×1017cm3 is investigated from 50to750cm−1 using infrared synchrotron radiation. E1 phonon is separately observed from plasma oscillation, and in the energy range below E1(TO), phonon polariton is observed up to 104cm−1. The lifetime of the E1(TO) phonon is directly determined by the reflectivity measurements. From the temperature dependence of the lifetime, the E1(TO) phonon primarily decays into phonons with a renormalized frequency of 177cm−1. From the plasma edge position the electron effective mass is estimated to be me⊥=0.076m0 for the intrinsic InN.
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